Development of MHz X-ray phase contrast imaging at the European XFEL.

Autor: Koliyadu JCP; European XFEL GmbH, Schenefeld, Germany., Moško D; University of P. J. Šafárik, Kosice, Slovakia., Asimakopoulou EM; Synchrotron Radiation Research and NanoLund, Lund University, Sweden., Bellucci V; European XFEL GmbH, Schenefeld, Germany., Birnšteinová Š; European XFEL GmbH, Schenefeld, Germany., Bean R; European XFEL GmbH, Schenefeld, Germany., Letrun R; European XFEL GmbH, Schenefeld, Germany., Kim C; European XFEL GmbH, Schenefeld, Germany., Kirkwood H; European XFEL GmbH, Schenefeld, Germany., Giovanetti G; European XFEL GmbH, Schenefeld, Germany., Jardon N; European XFEL GmbH, Schenefeld, Germany., Szuba J; European XFEL GmbH, Schenefeld, Germany., Guest T; European XFEL GmbH, Schenefeld, Germany., Koch A; European XFEL GmbH, Schenefeld, Germany., Grünert J; European XFEL GmbH, Schenefeld, Germany., Szeles P; University of P. J. Šafárik, Kosice, Slovakia., Villanueva-Perez P; Synchrotron Radiation Research and NanoLund, Lund University, Sweden., Reuter F; Faculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany., Ohl CD; Faculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany., Noack MA; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany., Garcia-Moreno F; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany., Kuglerová-Valdová Z; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Juha L; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Nikl M; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Yashiro W; International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Soyama H; Department of Finemechanics, Tohoku University, 6-6-01 Aramaki, Aoba-ku, Sendai 980-8579, Japan., Eakins D; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom., Korsunsky AM; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom., Uličný J; University of P. J. Šafárik, Kosice, Slovakia., Meents A; Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany., Chapman HN; Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany., Mancuso AP; European XFEL GmbH, Schenefeld, Germany., Sato T; European XFEL GmbH, Schenefeld, Germany., Vagovič P; European XFEL GmbH, Schenefeld, Germany.
Jazyk: angličtina
Zdroj: Journal of synchrotron radiation [J Synchrotron Radiat] 2025 Jan 01. Date of Electronic Publication: 2025 Jan 01.
DOI: 10.1107/S160057752400986X
Abstrakt: We report on recent developments that enable megahertz hard X-ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementation of the key components, including an MHz fast camera and a modular indirect X-ray microscope system based on fast scintillators coupled through a high-resolution optical microscope, which enable full-field X-ray microscopy with phase contrast of fast and irreversible phenomena. The image quality for MHz XPCI data showed significant improvement compared with a pilot demonstration of the technique using parallel beam illumination, which also allows access to up to 24 keV photon energies at the SPB/SFX instrument of the EuXFEL. With these developments, MHz XPCI was implemented as a new method offered for a broad user community (academic and industrial) and is accessible via standard user proposals. Furthermore, intra-train pulse diagnostics with a high few-micrometre spatial resolution and recording up to 128 images of consecutive pulses in a train at up to 1.1 MHz repetition rate is available upstream of the instrument. Together with the diagnostic camera upstream of the instrument and the MHz XPCI setup at the SPB/SFX instrument, simultaneous two-plane measurements for future beam studies and feedback for machine parameter tuning are now possible.
(open access.)
Databáze: MEDLINE
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