Advances in Spectro-Microscopy Methods and their Applications in the Characterization of Perovskite Materials.

Autor: Luo Y; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA., Wieghold S; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA., Nienhaus L; Department of Chemistry, Rice University, Houston, TX, 77005, USA.; Department of Physics, Rice University, Houston, TX, 77005, USA.; Rice Advanced Materials Institute, Rice University, Houston, TX, 77005, USA.
Jazyk: angličtina
Zdroj: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Nov 06, pp. e2411916. Date of Electronic Publication: 2024 Nov 06.
DOI: 10.1002/adma.202411916
Abstrakt: Perovskite materials are promising contenders as the active layer in light-harvesting and light-emitting applications if their long-term stability can be sufficiently increased. Chemical and structural engineering are shown to enhance long-term stability, but the increased complexity of the material system also leads to inhomogeneous functional properties across various length scales. Thus, scanning probe and high-resolution microscopy characterization techniques are needed to reveal the role of local defects and the results promise to act as the foundation for future device improvements. A look at the parameter space: technique-specific sample penetration depth versus probe size highlights a gap in current methods. High spatial resolution combined with a deep penetration depth is not yet achievable. However, multimodal measurement technique may be the key to covering this parameter space. In this perspective, current advanced spectro-microscopy methods which have been applied to perovskite materials are highlighted.
(© 2024 Wiley‐VCH GmbH.)
Databáze: MEDLINE
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