X-ray sources for in situ wavelength calibration of x-ray imaging crystal spectrometers.

Autor:	Shah K; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Delgado-Aparicio L; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Kraus BF; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Ono M; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Gao L; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Umbach B; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Perkins L; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Pablant N; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Hill KW; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Bitter M; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA., Teall S; Proto Manufacturing Inc., Taylor, Michigan 48180, USA., Drake R; Proto Manufacturing Inc., Taylor, Michigan 48180, USA., Schmidt G; Proto Manufacturing Inc., Taylor, Michigan 48180, USA.
Jazyk:	angličtina
Zdroj:	The Review of scientific instruments [Rev Sci Instrum] 2024 Sep 01; Vol. 95 (9).
DOI:	10.1063/5.0219583
Abstrakt:	X-ray sources for a range of wavelengths are being considered for in situ calibration of X-ray Imaging Crystal Spectrometers (XICSs) and for monitoring line shifts due to changes in the crystal temperature, which can vary during experimental operation over a day [A. Ince-Cushman et al., Rev. Sci. Instrum. 79, 10E302 (2008), L. Delgado-Aparicio et al., Plasma Phys. Control. Fusion 55, 125011 (2013)]. Such crystal temperature dependent shifts, if not accounted for, could be erroneously interpreted as Doppler shifts leading to errors in plasma flow-velocity measurements. The x-ray sources encompass characteristic x-ray lines falling within the wavelength range of 0.9-4.0 Å, relevant for the XICSs on present and future fusion devices. Several technological challenges associated with the development of x-ray sources for in situ calibration are identified and are being addressed in the design of multiple x-ray tubes, which will be installed inside the spectrometer housing of the XICS for the JT-60SA tokamak. These x-ray sources will be especially useful for in situ calibration between plasma discharges. In this paper, laboratory experiments are described that were conducted with a Cu x-ray source, a heated quartz (102) crystal, and a pixelated Pilatus detector to measure the temperature dependent shifts of the Cu Kα1 and Kα2 lines at 1.5405 and 1.5443 Å, respectively, and to evaluate the 2d-lattice constant for the Bragg reflecting crystal planes as a function of temperature, which, in the case of in situ wavelength calibration, would have to be used for numerical analysis of the x-ray spectra from the plasma. (© 2024 Author(s). Published under an exclusive license by AIP Publishing.)
Databáze:	MEDLINE
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