X-Ray Multibeam Ptychography at up to 20 keV: Nano-Lithography Enhances X-Ray Nano-Imaging.

Autor: Li T; Centre for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany., Kahnt M; MAX IV Laboratory, Lund University, Box 118, Lund, 221 00, Sweden., Sheppard TL; Karlsruhe Institute of Technology, Institute for Chemical Technology and Polymer Chemistry, Engesserstr. 20, 76131, Karlsruhe, Germany.; Leipzig University, Institute of Chemical Technology, Linnéstr. 3, 04103, Leipzig, Germany., Yang R; Division of Synchrotron Radiation Research and NanoLund, Department of Physics, Lund University, Lund, 22100, Sweden., Falch KV; Centre for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany., Zvagelsky R; Karlsruher Institut für Technologie, Institut für Angewandte Physik, Wolfgang-Gaede-Straße 1, D-76131, Karlsruhe, Germany., Villanueva-Perez P; Division of Synchrotron Radiation Research and NanoLund, Department of Physics, Lund University, Lund, 22100, Sweden., Wegener M; Karlsruher Institut für Technologie, Institut für Angewandte Physik, Wolfgang-Gaede-Straße 1, D-76131, Karlsruhe, Germany., Lyubomirskiy M; Centre for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.
Jazyk: angličtina
Zdroj: Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2024 Aug; Vol. 11 (30), pp. e2310075. Date of Electronic Publication: 2024 Jun 23.
DOI: 10.1002/advs.202310075
Abstrakt: Hard X-rays are needed for non-destructive nano-imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest-quality images with single-digit nm resolution using advanced techniques such as X-ray ptychography. However, the resolution or field of view is ultimately constrained by the available coherent flux. To address this, the beam's incoherent fraction can be exploited using multiple parallel beams in an X-ray multibeam ptychography (MBP) approach. This expands the domain of X-ray ptychography to larger samples or more rapid measurements. Both qualities favor the study of complex composite or functional samples, such as catalysts, energy materials, or electronic devices. The challenge of performing ptychography at high energy and with many parallel beams must be overcome to extract the full advantages for extended samples while minimizing beam attenuation. Here, that challenge is overcome by creating a lens array using cutting-edge laser printing technology and applying it to perform scanning with MBP with up to 12 beams and at photon energies of 13 and 20 keV. This exceeds the measurement limits of conventional hard X-ray ptychography without compromising image quality for various samples: Siemens star test pattern, Ni/Al 2 O 3 catalyst, microchip, and gold nano-crystal clusters.
(© 2024 The Author(s). Advanced Science published by Wiley‐VCH GmbH.)
Databáze: MEDLINE
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