Atomic force microscopy in mechanical measurements of single nanowires.

Autor: Pruchnik BC; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland., Fidelus JD; Time and Length Department, Central Office of Measures, Elektoralna 2, Warsaw 00-139, Poland. Electronic address: janusz.fidelus@gum.gov.pl., Gacka E; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland., Mika K; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Zaraska L; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Sulka GD; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Gotszalk TP; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland.
Jazyk: angličtina
Zdroj: Ultramicroscopy [Ultramicroscopy] 2024 Sep; Vol. 263, pp. 113985. Date of Electronic Publication: 2024 May 07.
DOI: 10.1016/j.ultramic.2024.113985
Abstrakt: In this paper, we present the results of mechanical measurement of single nanowires (NWs) in a repeatable manner. Substrates with specifically designed mechanical features were used for NW placement and localization for measurements of properties such as Young's modulus or tensile strength of NW with an atomic force microscopy (AFM) system. Dense arrays of zinc oxide (ZnO) nanowires were obtained by one-step anodic oxidation of metallic Zn foil in a sodium bicarbonate electrolyte and thermal post-treatment. ZnO NWs with a hexagonal wurtzite structure were fixed to the substrates using focused electron beam-induced deposition (FEBID) and were annealed at different temperatures in situ. We show a 10-fold change in the properties of annealed materials as well as a difference in the properties of the NW materials from their bulk values with pre-annealed Young modulus at the level of 20 GPa and annealed reaching 200 GPa. We found the newly developed method to be much more versatile, allowing for in situ operations of NWs, including measurements with different methods of scanning probe microscopy.
Competing Interests: Declaration of competing interest The authors declare no conflict of interest.
(Copyright © 2024 Elsevier B.V. All rights reserved.)
Databáze: MEDLINE
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