Autor: |
Acharyya P; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Pal K; Dept. of Physics, Indian Institute of Technology Kanpur, Kanpur 208016, India.; Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos 87545, United States., Zhang B; College of Physics and Institute of Advanced Interdisciplinary Studies, Chongqing University, Chongqing 401331, China.; Analytical and Testing Center of Chongqing University, Chongqing 401331, China., Barbier T; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Prestipino C; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Boullay P; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Raveau B; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Lemoine P; Institut Jean Lamour, UMR 7198 CNRS - Université de Lorraine, 54011 Nancy, France., Malaman B; Institut Jean Lamour, UMR 7198 CNRS - Université de Lorraine, 54011 Nancy, France., Shen X; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Vaillant M; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France., Renaud A; Univ Rennes, ISCR - UMR 6226, CNRS, F-35000 Rennes, France., Uberuaga BP; Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos 87545, United States., Candolfi C; Institut Jean Lamour, UMR 7198 CNRS - Université de Lorraine, 54011 Nancy, France., Zhou X; College of Physics and Institute of Advanced Interdisciplinary Studies, Chongqing University, Chongqing 401331, China.; Analytical and Testing Center of Chongqing University, Chongqing 401331, China., Guilmeau E; CRISMAT, CNRS, Normandie Univ, ENSICAEN, UNICAEN, 14000 Caen, France. |