| Autor: |
Wang X; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. jyoo@lanl.gov., Kim K; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. jyoo@lanl.gov., Derby BK; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. jyoo@lanl.gov., McGuckin T; Ephemeron-Labs, Inc., Philadelphia, PA 19134, USA., Calderón GA; Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210, USA., Pettes MT; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. jyoo@lanl.gov., Hwang J; Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210, USA., Kim Y; Interdisciplinary Materials Measurement Institute, Korea Research Institute of Standards and Science, Daejeon 34133, Republic of Korea., Park J; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea., Chen A; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. jyoo@lanl.gov., Kang K; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea., Yoo J; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. jyoo@lanl.gov. |
