| Autor: |
Nedzbala HS; Department of Chemistry, Yale University, New Haven, Connecticut 06520-8107, United States., Westbroek D; Department of Chemistry, Yale University, New Haven, Connecticut 06520-8107, United States., Margavio HRM; Department of Chemical and Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27603, United States., Yang H; Department of Chemical and Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27603, United States., Noh H; Department of Chemistry, Yale University, New Haven, Connecticut 06520-8107, United States., Magpantay SV; Department of Chemistry, Yale University, New Haven, Connecticut 06520-8107, United States., Donley CL; Department of Chemistry, Chapel Hill Analytical and Nanofabrication Laboratory (CHANL), University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, United States., Kumbhar AS; Department of Chemistry, Chapel Hill Analytical and Nanofabrication Laboratory (CHANL), University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, United States., Parsons GN; Department of Chemical and Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27603, United States., Mayer JM; Department of Chemistry, Yale University, New Haven, Connecticut 06520-8107, United States. |
| Abstrakt: |
TiO 2 thin films are often used as protective layers on semiconductors for applications in photovoltaics, molecule-semiconductor hybrid photoelectrodes, and more. Experiments reported here show that TiO 2 thin films on silicon are electrochemically and photoelectrochemically reduced in buffered acetonitrile at potentials relevant to photoelectrocatalysis of CO 2 reduction, N 2 reduction, and H 2 evolution. On both n-type Si and irradiated p-type Si, TiO 2 reduction is proton-coupled with a 1e - :1H + stoichiometry, as demonstrated by the Nernstian dependence of the Ti 4+/3+ E 1/2 on the buffer p K a . Experiments were conducted with and without illumination, and a photovoltage of ∼0.6 V was observed across 20 orders of magnitude in proton activity. The 4 nm films are almost stoichiometrically reduced under mild conditions. The reduced films catalytically transfer protons and electrons to hydrogen atom acceptors, based on cyclic voltammogram, bulk electrolysis, and other mechanistic evidence. TiO 2 /Si thus has the potential to photoelectrochemically generate high-energy H atom carriers. Characterization of the TiO 2 films after reduction reveals restructuring with the formation of islands, rendering TiO 2 films as a potentially poor choice as protecting films or catalyst supports under reducing and protic conditions. Overall, this work demonstrates that atomic layer deposition TiO 2 films on silicon photoelectrodes undergo both chemical and morphological changes upon application of potentials only modestly negative of RHE in these media. While the results should serve as a cautionary tale for researchers aiming to immobilize molecular monolayers on "protective" metal oxides, the robust proton-coupled electron transfer reactivity of the films introduces opportunities for the photoelectrochemical generation of reactive charge-carrying mediators. |
