Autor: |
Bocarsly M; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Uzan M; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Roy I; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Grover S; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Xiao J; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Dong Z; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Labendik M; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Uri A; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Huber ME; Departments of Physics and Electrical Engineering, University of Colorado Denver, Denver, CO 80217, USA., Myasoedov Y; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Watanabe K; Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan., Taniguchi T; Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan., Yan B; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel., Levitov LS; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Zeldov E; Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 7610001, Israel. |