Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines.

Autor: Ringleb S; Friedrich Schiller-Universität Jena, 07743, Jena, Germany. stefan.ringleb@uni-jena.de., Kiffer M; Friedrich Schiller-Universität Jena, 07743, Jena, Germany., Ballentin JKC; Friedrich Schiller-Universität Jena, 07743, Jena, Germany.; University of Vienna, 1090, Vienna, Austria., Stöhlker T; Friedrich Schiller-Universität Jena, 07743, Jena, Germany.; Helmholtz-Institut Jena, 07743, Jena, Germany.; GSI Helmholtzzentrum für Schwerionenforschung, 64291, Darmstadt, Germany., Vogel M; GSI Helmholtzzentrum für Schwerionenforschung, 64291, Darmstadt, Germany.
Jazyk: angličtina
Zdroj: Scientific reports [Sci Rep] 2023 Dec 19; Vol. 13 (1), pp. 22669. Date of Electronic Publication: 2023 Dec 19.
DOI: 10.1038/s41598-023-45798-6
Abstrakt: We have developed and operated an electronic detection system for the non-destructive single-pass detection of bunches of charged particles in a beamline that allows for a measurement of their lateral position with respect to the central beamline axis on a shot-to-shot basis. It provides all features of our related development reported in Kiffer et al. (Rev Sci Instrum 90:113301, 2019), namely single-pass measurement of bunch length, kinetic energy and absolute charge, and is additionally designed to provide the lateral position of bunches with sub-mm accuracy. We show the setup, associated methods and provide characterizing measurements with bunches of highly charged ions in the keV regime of kinetic energy that demonstrate the capabilities and show a typical application.
(© 2023. The Author(s).)
Databáze: MEDLINE
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