| Autor: |
Fern CL; Department of Materials Science and Engineering, National Chung Hsing University, Taichung 40227, Taiwan., Liu WJ; Department of Materials Science and Engineering, I-Shou University, Kaohsiung 84001, Taiwan., Chang YH; Bachelor Program in Industrial Technology, National Yunlin University of Science and Technology, 123 University Road, Section 3, Yunlin, Douliou 64002, Taiwan., Chiang CC; Department of Mechanical Engineering, National Kaohsiung University of Science and Technology, Kaohsiung 80778, Taiwan., Chen YT; Graduate School of Materials Science, National Yunlin University of Science and Technology, 123 University Road, Section 3, Yunlin, Douliou 64002, Taiwan., Lu PX; Graduate School of Materials Science, National Yunlin University of Science and Technology, 123 University Road, Section 3, Yunlin, Douliou 64002, Taiwan., Su XM; Graduate School of Materials Science, National Yunlin University of Science and Technology, 123 University Road, Section 3, Yunlin, Douliou 64002, Taiwan., Lin SH; Department of Electronic Engineering, National Yunlin University of Science and Technology, 123 University Road, Section 3, Yunlin, Douliou 64002, Taiwan., Lin KW; Department of Materials Science and Engineering, National Chung Hsing University, Taichung 40227, Taiwan. |
| Abstrakt: |
Co 60 Fe 20 Sm 20 thin films were deposited onto glass substrates in a high vacuum setting. The films varied in thickness from 10 to 50 nm and underwent annealing processes at different temperatures: room temperature (RT), 100, 200, and 300 °C. Our analysis encompassed structural, magnetic, electrical, nanomechanical, adhesive, and optical properties in relation to film thickness and annealing temperature. X-ray diffraction (XRD) analysis did not reveal characteristic peaks in Co 60 Fe 20 Sm 20 thin films due to insufficient growth-driving forces. Electrical measurements indicated reduced resistivity and sheet resistance with increasing film thickness and higher annealing temperatures, owing to hindered current-carrier transport resulting from the amorphous structure. Atomic force microscope (AFM) analysis showed a decrease in surface roughness with increased thickness and annealing temperature. The low-frequency alternating current magnetic susceptibility (χ ac ) values increased with film thickness and annealing temperature. Nanoindentation analysis demonstrated reduced film hardness and Young's modulus with thicker films. Contact angle measurements suggested a hydrophilic film. Surface energy increased with greater film thickness, particularly in annealed films, indicating a decrease in contact angle contributing to this increase. Transmittance measurements have revealed intensified absorption and reduced transmittance with thicker films. In summary, the surface roughness of CoFeSm films at different annealing temperatures significantly influenced their magnetic, electrical, adhesive, and optical properties. A smoother surface reduced the pinning effect on the domain walls, enhancing the χ ac value. Additionally, diminished surface roughness led to a lower contact angle and higher surface energy. Additionally, smoother surfaces exhibited higher carrier conductivity, resulting in reduced electrical resistance. The optical transparency decreased due to the smoother surface of Co 60 Fe 20 Sm 20 films. |
