| Autor: |
Lee W, Chung D, Kang J, Jeon H, Jung C, Cho DD, Kim T |
| Jazyk: |
angličtina |
| Zdroj: |
Optics express [Opt Express] 2023 Oct 09; Vol. 31 (21), pp. 33787-33798. |
| DOI: |
10.1364/OE.497721 |
| Abstrakt: |
Excess micromotion is detrimental to accurate qubit control of trapped ions, thus measuring and minimizing it is crucial. In this paper, we present a simple approach for measuring and suppressing excess micromotion of trapped ions by leveraging the existing laser-driven qubit transition scheme combined with direct scanning of dc voltages. The compensation voltage is deduced by analyzing the Bessel expansion of a scanned qubit transition rate. The method provides a fair level of sensitivity for practical quantum computing applications, while demanding minimal deviation of trap condition. By accomplishing compensation of excess micromotion in the qubit momentum-excitation direction, the scheme offers an additional avenue for excess micromotion compensation, complementing existing compensation schemes. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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