Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers.

Autor: Dresselhaus-Marais LE; Department of Materials Science & Engineering, Stanford University, Stanford, CA, USA. leoradm@stanford.edu.; SLAC National Accelerator Laboratory, Menlo Park, CA, USA. leoradm@stanford.edu.; Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA. leoradm@stanford.edu., Kozioziemski B; Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA., Holstad TS; Department of Physics, Technical University of Denmark, Lyngby, Denmark., Ræder TM; Department of Physics, Technical University of Denmark, Lyngby, Denmark., Seaberg M; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Nam D; Photon Science Center, Pohang University and Science and Technology, Pohang, Korea.; XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea., Kim S; XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea., Breckling S; Nevada National Security Sites, Las Vegas, NV, USA., Choi S; Department of Physics, Sogang University, Seoul, Korea., Chollet M; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Cook PK; University of Natural Resources and Life Sciences, BOKU, Vienna, Austria.; European Synchrotron Radiation Facility, Grenoble, France., Folsom E; Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA., Galtier E; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Gonzalez A; Nevada National Security Sites, Las Vegas, NV, USA., Gorkhover T; SLAC National Accelerator Laboratory, Menlo Park, CA, USA.; University of Hamburg, Hamburg, Germany., Guillet S; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Haldrup K; Department of Physics, Technical University of Denmark, Lyngby, Denmark., Howard M; Nevada National Security Sites, Las Vegas, NV, USA., Katagiri K; Department of Materials Science & Engineering, Stanford University, Stanford, CA, USA.; Graduate School of Engineering, Osaka University, Osaka, Japan., Kim S; XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea., Kim S; XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea., Kim S; Department of Physics, Sogang University, Seoul, Korea., Kim H; Department of Physics, Sogang University, Seoul, Korea., Knudsen EB; Department of Physics, Technical University of Denmark, Lyngby, Denmark., Kuschel S; SLAC National Accelerator Laboratory, Menlo Park, CA, USA.; Institute of Nuclear Physics, Technical University of Darmstadt, Darmstadt, Germany., Lee HJ; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Lin C; Center for High Pressure Science & Technology Advanced Research, Shanghai, China., McWilliams RS; School of Physics and Astronomy, University of Edinburgh, Edinburgh, UK., Nagler B; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Nielsen MM; Department of Physics, Technical University of Denmark, Lyngby, Denmark., Ozaki N; Graduate School of Engineering, Osaka University, Osaka, Japan., Pal D; Department of Materials Science & Engineering, Stanford University, Stanford, CA, USA.; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Pablo Pedro R; Department of Nuclear Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Saunders AM; Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA., Schoofs F; UK Atomic Energy Authority, Culham Science Centre, Abingdon, UK., Sekine T; Center for High Pressure Science & Technology Advanced Research, Shanghai, China., Simons H; Department of Physics, Technical University of Denmark, Lyngby, Denmark., van Driel T; SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Wang B; Center for High Pressure Science & Technology Advanced Research, Shanghai, China., Yang W; Center for High Pressure Science & Technology Advanced Research, Shanghai, China., Yildirim C; European Synchrotron Radiation Facility, Grenoble, France.; Université Grenoble Alpes, CEA, Grenoble, France., Poulsen HF; Department of Physics, Technical University of Denmark, Lyngby, Denmark., Eggert JH; Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA.
Jazyk: angličtina
Zdroj: Scientific reports [Sci Rep] 2023 Oct 16; Vol. 13 (1), pp. 17573. Date of Electronic Publication: 2023 Oct 16.
DOI: 10.1038/s41598-023-35526-5
Abstrakt: The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the [Formula: see text] photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
(© 2023. Springer Nature Limited.)
Databáze: MEDLINE
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