| Autor: |
Guan F; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China., Guo X; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China., Zeng K; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China., Zhang S; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China., Nie Z; Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA., Ma S; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China., Dai Q; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China., Pendry J; The Blackett Laboratory, Department of Physics, Imperial College London, SW7 2AZ London, UK., Zhang X; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.; Faculty of Science, University of Hong Kong, Hong Kong, China.; Faculty of Engineering, University of Hong Kong, Hong Kong, China., Zhang S; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.; Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong, China. |
