| Autor: |
Klose C; Max Born Institute, Berlin, Germany., Büttner F; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA. felix.buettner@helmholtz-berlin.de.; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA. felix.buettner@helmholtz-berlin.de.; Helmholtz-Zentrum für Materialien und Energie, Berlin, Germany. felix.buettner@helmholtz-berlin.de., Hu W; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA. wenhu@bnl.gov., Mazzoli C; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA., Litzius K; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Battistelli R; Helmholtz-Zentrum für Materialien und Energie, Berlin, Germany., Zayko S; IV Physical Institute, University of Göttingen, Göttingen, Germany., Lemesh I; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Bartell JM; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Huang M; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Günther CM; Zentraleinrichtung Elektronenmikroskopie (ZELMI), Technische Universität Berlin, Berlin, Germany., Schneider M; Max Born Institute, Berlin, Germany., Barbour A; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA., Wilkins SB; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA., Beach GSD; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Eisebitt S; Max Born Institute, Berlin, Germany.; Institut für Optik und Atomare Physik, Technische Universität Berlin, Berlin, Germany., Pfau B; Max Born Institute, Berlin, Germany. |
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