Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL.

Autor:	Le Guyader L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Eschenlohr A; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Beye M; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Schlotter W; Linear Coherent Light Source, SLAC National Accelerator Lab, 2575 Sand Hill Rd, Menlo Park, CA 94025, USA., Döring F; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Carinan C; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hickin D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Agarwal N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Boeglin C; Université de Strasbourg, CNRS, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504, F-67000 Strasbourg, France., Bovensiepen U; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Buck J; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Carley R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Castoldi A; Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy., D'Elia A; IOM-CNR, Laboratorio Nazionale TASC, Basovizza SS-14, km 163.5, 34012 Trieste, Italy., Delitz JT; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Ehsan W; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Engel R; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Erdinger F; Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany., Fangohr H; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Fischer P; Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany., Fiorini C; Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy., Föhlisch A; Institute for Methods and Instrumentation for Synchrotron Radiation Research (PS-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), Albert-Einstein Straße 15, 12489 Berlin, Germany., Gelisio L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gensch M; Institute of Optical Sensor Systems, DLR (German Aerospace Center), Rutherfordstrasse 2, 12489 Berlin, Germany., Gerasimova N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gort R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hansen K; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Hauf S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Izquierdo M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Jal E; Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France., Kamil E; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Karabekyan S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kluyver T; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Laarmann T; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Lojewski T; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Lomidze D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Maffessanti S; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Mamyrbayev T; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Marcelli A; INFN - Laboratori Nazionali di Frascati, via Enrico Fermi 54, 00044 Frascati, Italy., Mercadier L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Mercurio G; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Miedema PS; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Ollefs K; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Rossnagel K; Institute of Experimental and Applied Physics, Kiel University, 24098 Kiel, Germany., Rösner B; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Rothenbach N; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Samartsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Schlappa J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Setoodehnia K; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Sorin Chiuzbaian G; Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France., Spieker L; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Stamm C; Department of Materials, ETH Zürich, 8093 Zürich, Switzerland., Stellato F; Physics Department, University of Rome Tor Vergata and INFN-Sezione di Roma Tor Vergata, Via della Ricerca Scientifica 1, 00133 Roma, Italy., Techert S; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Teichmann M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Turcato M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Van Kuiken B; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Wende H; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Yaroslavtsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Zhu J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Molodtsov S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., David C; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Porro M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Scherz A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.
Jazyk:	angličtina
Zdroj:	Journal of synchrotron radiation [J Synchrotron Radiat] 2023 Mar 01; Vol. 30 (Pt 2), pp. 284-300. Date of Electronic Publication: 2023 Feb 20.
DOI:	10.1107/S1600577523000619
Abstrakt:	Femtosecond transient soft X-ray absorption spectroscopy (XAS) is a very promising technique that can be employed at X-ray free-electron lasers (FELs) to investigate out-of-equilibrium dynamics for material and energy research. Here, a dedicated setup for soft X-rays available at the Spectroscopy and Coherent Scattering (SCS) instrument at the European X-ray Free-Electron Laser (European XFEL) is presented. It consists of a beam-splitting off-axis zone plate (BOZ) used in transmission to create three copies of the incoming beam, which are used to measure the transmitted intensity through the excited and unexcited sample, as well as to monitor the incoming intensity. Since these three intensity signals are detected shot by shot and simultaneously, this setup allows normalized shot-by-shot analysis of the transmission. For photon detection, an imaging detector capable of recording up to 800 images at 4.5 MHz frame rate during the FEL burst is employed, and allows a photon-shot-noise-limited sensitivity to be approached. The setup and its capabilities are reviewed as well as the online and offline analysis tools provided to users. (open access.)
Databáze:	MEDLINE
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