| Autor: |
Hoogerheide SF; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Caylor J; University of Tennessee, Knoxville, TN 37996, USA., Adamek ER; University of Tennessee, Knoxville, TN 37996, USA., Anderson ES; Indiana University, Bloomington, IN 47408, USA., Biswas R; Tulane University, New Orleans, LA 70118, USA., Chavali SM; University of Maryland, College Park, MD 20742, USA., Crawford B; Gettysburg College, Gettysburg, PA 17325, USA., DeAngelis C; Tulane University, New Orleans, LA 70118, USA., Dewey MS; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Fomin N; University of Tennessee, Knoxville, TN 37996, USA., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Grammer KB; Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA., Greene GL; University of Tennessee, Knoxville, TN 37996, USA.; Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA., Haun RW; Tulane University, New Orleans, LA 70118, USA., Ivanov JA; Georgetown University, Washington, DC 20057, USA., Li F; Gettysburg College, Gettysburg, PA 17325, USA., Mulholland J; University of Tennessee, Knoxville, TN 37996, USA., Mumm HP; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Nico JS; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Snow WM; Indiana University, Bloomington, IN 47408, USA., Valete D; Gettysburg College, Gettysburg, PA 17325, USA., Wietfeldt FE; Tulane University, New Orleans, LA 70118, USA., Yue AT; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. |
