High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III.

Autor: Levcenko S; Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany., Biller R; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany., Pfeiffelmann T; Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany., Ritter K; Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany., Falk HH; Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany., Wang T; Laboratory for Photovoltaics, Department of Physics and Materials Science, University of Luxembourg, Rue du Brill 41, 4422 Belvaux, Luxembourg., Siebentritt S; Laboratory for Photovoltaics, Department of Physics and Materials Science, University of Luxembourg, Rue du Brill 41, 4422 Belvaux, Luxembourg., Welter E; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany., Schnohr CS; Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany.
Jazyk: angličtina
Zdroj: Journal of synchrotron radiation [J Synchrotron Radiat] 2022 Sep 01; Vol. 29 (Pt 5), pp. 1209-1215. Date of Electronic Publication: 2022 Aug 11.
DOI: 10.1107/S1600577522007287
Abstrakt: A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe 2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.
(open access.)
Databáze: MEDLINE