Recommendations on the preparation of silicon solar cell samples for defect etching.

Autor:	Pacho AP; Department of Engineering and Physics, Karlstad University, Karlstad 651 88, Sweden., Rinio M; Department of Engineering and Physics, Karlstad University, Karlstad 651 88, Sweden.
Jazyk:	angličtina
Zdroj:	MethodsX [MethodsX] 2022 Aug 08; Vol. 9, pp. 101813. Date of Electronic Publication: 2022 Aug 08 (Print Publication: 2022).
DOI:	10.1016/j.mex.2022.101813
Abstrakt:	Research on the structural defects of silicon such as grain boundaries and dislocations, their spatial distribution and how they impact the resulting solar cell performance often proceed by polishing the sample, etching to reveal the dislocations and grain boundaries, and then scanning the surface to image the defects and record their corresponding positions. While a lot of work has been devoted to developing appropriate etches and how to correlate the etch pits to cell performance, materials pertaining to preparation of samples for defect etching, which is a crucial step to ensure successful imaging and analysis, are limited. This work describes a method of polishing multicrystalline silicon solar cell samples in preparation for defect etching. The method described herein: • Utilizes both mechanical and chemical mechanical polishing. • Can be applied to both fabricated silicon solar cells and as-cut wafers. Competing Interests: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper. (© 2022 The Authors.)
Databáze:	MEDLINE
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