Autor: |
Lan Q; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.; National Center for Electron Microscopy in Beijing, Key Laboratory of Advanced Materials (MOE), School of Materials Science and Engineering, Tsinghua University, Beijing 100084, People's Republic of China., Wang C; Department of Physics, Southern University of Science and Technology, Shenzhen 518055, People's Republic of China., Jin L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Schnedler M; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Freter L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Fischer K; Department of Mechanical and Electrical Engineering, National Institute of Technology, Tokuyama College, Gakuendai, Shunan, Yamaguchi, 745-8585, Japan., Caron J; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Wei XK; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Denneulin T; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Kovács A; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Ebert P; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Zhong X; TRACE EM Unit and Department of Materials Science and Engineering, City University of Hong Kong, Kowloon 999077, Hong Kong SAR, People's Republic of China.; City University of Hong Kong, Shenzhen Futian Research Institute, Shenzhen 518048, People's Republic of China.; Nanomanufacturing Laboratory, City University of Hong Kong, Shenzhen Research Institute, Shenzhen 518057, People's Republic of China., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. |