Autor: |
Han SS; NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States.; Department of Materials Science and Engineering, Seoul National University, Seoul 08826, South Korea., Ko TJ; NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States., Shawkat MS; NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States., Shum AK, Bae TS; Analytical Research Division, Korea Basic Science Institute, Jeonju 54907, South Korea., Chung HS; Analytical Research Division, Korea Basic Science Institute, Jeonju 54907, South Korea., Ma J; Department of Chemical and Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27606, United States., Sattar S; Applied Physics, Division of Materials Science, Department of Engineering Sciences and Mathematics, Luleå University of Technology, Luleå SE-97187, Sweden.; Department of Physics and Electrical Engineering, Linnaeus University, SE-39231 Kalmar, Sweden., Hafiz SB; Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, New Jersey 07102, United States., Mahfuz MMA; Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, New Jersey 07102, United States., Mofid SA; NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States., Larsson JA; Applied Physics, Division of Materials Science, Department of Engineering Sciences and Mathematics, Luleå University of Technology, Luleå SE-97187, Sweden., Oh KH; Department of Materials Science and Engineering, Seoul National University, Seoul 08826, South Korea., Ko DK; Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, New Jersey 07102, United States., Jung Y; NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States. |