Autor: |
Chen H; Department of Agronomy, Kansas State University, Manhattan, KS, USA., Su Z; Department of Agronomy, Kansas State University, Manhattan, KS, USA.; College of Agriculture and Biotechnology, China Agricultural University, Beijing, China., Tian B; Department of Plant Pathology, Kansas State University, Manhattan, KS, USA., Liu Y; Department of Agronomy, Kansas State University, Manhattan, KS, USA.; Jiaxing Vocational and Technical College, Jiaxing, Zhejiang, China., Pang Y; Department of Agronomy, Kansas State University, Manhattan, KS, USA.; College of Agriculture, Henan University of Science and Technology, Luoyang, Henan, China., Kavetskyi V; Department of Agronomy, Kansas State University, Manhattan, KS, USA., Trick HN; College of Agriculture and Biotechnology, China Agricultural University, Beijing, China., Bai G; Department of Agronomy, Kansas State University, Manhattan, KS, USA.; USDA-ARS Hard Winter Wheat Genetics Research Unit, Manhattan, KS, USA. |