Autor: |
Barut B; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States.; Department of Physics, University at Buffalo, the State University of New York, Buffalo, New York 14260-1500, United States., Cantos-Roman X; Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115, United States., Crabb J; Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115, United States., Kwan CP; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States.; Department of Physics, University at Buffalo, the State University of New York, Buffalo, New York 14260-1500, United States., Dixit R; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., Arabchigavkani N; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States.; Department of Physics, University at Buffalo, the State University of New York, Buffalo, New York 14260-1500, United States., Yin S; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., Nathawat J; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., He K; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., Randle MD; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., Vandrevala F; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., Sugaya T; Global Zero Emission Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan., Einarsson E; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States.; Department of Materials Design and Innovation, University at Buffalo, the State University of New York, Buffalo, New York 14260-2000, United States., Jornet JM; Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115, United States., Bird JP; Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, New York 14260-2500, United States., Aizin GR; Kingsborough College, The City University of New York (CUNY), New York, New York 11235, United States. |