| Autor: |
Balasubramani V; Division of Biological and Environmental Sciences and Engineering, King Adullah University of Science and Technology, Thuwal 23955-6900, Saudi Arabia.; Institute of Electro-Optical Engineering, National Taiwan Normal University, Taipei 11677, Taiwan., Kujawińska M; Institute of Micromechanics and Photonics, Warsaw University of Technology, 02-525 Warsaw, Poland., Allier C; Univ. Grenoble Alpes, CEA, LETI, DTBS, 38000 Grenoble, France., Anand V; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn 3122, Australia., Cheng CJ; Institute of Electro-Optical Engineering, National Taiwan Normal University, Taipei 11677, Taiwan., Depeursinge C; Division of Biological and Environmental Sciences and Engineering, King Adullah University of Science and Technology, Thuwal 23955-6900, Saudi Arabia., Hai N; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, P.O. Box 653, Beer-Sheva 8410501, Israel., Juodkazis S; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn 3122, Australia.; Tokyo Tech World Research Hub Initiative (WRHI), School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550, Japan., Kalkman J; Department of Imaging Physics, TU Delft, Lorentzweg 1, 2628 CN Delft, The Netherlands., Kuś A; Institute of Micromechanics and Photonics, Warsaw University of Technology, 02-525 Warsaw, Poland., Lee M; Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea.; KAIST Institute for Health Science and Technology, KAIST, Daejeon 34141, Korea., Magistretti PJ; Division of Biological and Environmental Sciences and Engineering, King Adullah University of Science and Technology, Thuwal 23955-6900, Saudi Arabia., Marquet P; CERVO Brain Research Center, CIUSSS de la Capitale-Nationale, Québec, QC G1E 1T2, Canada.; Joint International Research Unit, Université Laval, Québec, QC G1V 0A6, Canada., Ng SH; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn 3122, Australia., Rosen J; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, P.O. Box 653, Beer-Sheva 8410501, Israel., Park YK; Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea.; KAIST Institute for Health Science and Technology, KAIST, Daejeon 34141, Korea.; Tomocube Inc., Daejeon 34109, Korea., Ziemczonok M; Institute of Micromechanics and Photonics, Warsaw University of Technology, 02-525 Warsaw, Poland. |
