Autor: |
Murbach JM; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Currlin S; Department of Neuroscience, University of Florida, Gainesville, FL 32611, USA., Widener A; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Tong Y; Department of Industrial and Systems Engineering, Virginia Tech, Blacksburg, VA 24061, USA., Chhatre S; Department of Materials Science and Engineering, University of Delaware, Newark, DE 19716, USA., Subramanian V; Department of Materials Science and Engineering, University of Delaware, Newark, DE 19716, USA., Martin DC; Department of Materials Science and Engineering, University of Delaware, Newark, DE 19716, USA., Johnson BN; Department of Industrial and Systems Engineering, Virginia Tech, Blacksburg, VA 24061, USA., Otto KJ; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA; Department of Neuroscience, University of Florida, Gainesville, FL 32611, USA; J. Crayton Pruitt Family Department of Biomedical Engineering, University of Florida, Gainesville, FL 32611, USA; Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL 32611, USA. |