The limits of near field immersion microwave microscopy evaluated by imaging bilayer graphene moiré patterns.

Autor: Ohlberg DAA; Microscopy Center, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Tami D; Microscopy Center, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil.; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brasil., Gadelha AC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Neto EGS; Instituto de Física, Universidade Federal da Bahia, Salvador, BA, Brazil., Santana FC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Miranda D; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Avelino W; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brasil., Watanabe K; National Institute for Materials Science (NIMS), Tsukuba-city, Ibaraki, Japan., Taniguchi T; National Institute for Materials Science (NIMS), Tsukuba-city, Ibaraki, Japan., Campos LC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Ramirez JC; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brasil.; Department of Electronic Engineering, School of Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., do Rego CG; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brasil.; Department of Electronic Engineering, School of Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Jorio A; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brasil.; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil.; Technology Innovation Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil., Medeiros-Ribeiro G; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brasil. gilberto@dcc.ufmg.br.; Computer Science Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil. gilberto@dcc.ufmg.br.
Jazyk: angličtina
Zdroj: Nature communications [Nat Commun] 2021 May 20; Vol. 12 (1), pp. 2980. Date of Electronic Publication: 2021 May 20.
DOI: 10.1038/s41467-021-23253-2
Abstrakt: Near field scanning Microwave Impedance Microscopy can resolve structures as small as 1 nm using radiation with wavelengths of 0.1 m. Combining liquid immersion microscopy concepts with exquisite force control exerted on nanoscale water menisci, concentration of electromagnetic fields in nanometer-size regions was achieved. As a test material we use twisted bilayer graphene, because it provides a sample where the modulation of the moiré superstructure pattern can be systematically tuned from Ångstroms up to tens of nanometers. Here we demonstrate that a probe-to-pattern resolution of 10 8 can be obtained by analyzing and adjusting the tip-sample distance influence on the dynamics of water meniscus formation and stability.
Databáze: MEDLINE
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