Autor: |
Kim S; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Schwenk J; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Walkup D; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Zeng Y; Department of Physics, Columbia University, New York, NY, USA., Ghahari F; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Le ST; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Theiss Research, La Jolla, CA, USA., Slot MR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Department of Physics, Georgetown University, Washington, DC, USA., Berwanger J; Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany., Blankenship SR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA., Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Ibaraki, Japan., Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Ibaraki, Japan., Giessibl FJ; Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany., Zhitenev NB; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA., Dean CR; Department of Physics, Columbia University, New York, NY, USA. cdean@phys.columbia.edu., Stroscio JA; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA. joseph.stroscio@nist.gov. |