Using Mass Resolving Power as a Performance Metric in the Atom Probe.
| Autor: | Meisenkothen F; National Institute for Standards and Technology, Gaithersburg, MD U.S.A., Kelly TF; CAMECA Instruments, Inc., Madison, WI U.S.A., Oltman E; CAMECA Instruments, Inc., Madison, WI U.S.A., Bunton JH; CAMECA Instruments, Inc., Madison, WI U.S.A., Renaud L; CAMECA SA, Gennevilliers, France., Larson DJ; CAMECA Instruments, Inc., Madison, WI U.S.A. |
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| Jazyk: | angličtina |
| Zdroj: | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2016 Jul; Vol. 22 (Suppl 3), pp. 680-681. Date of Electronic Publication: 2016 Jul 25. |
| DOI: | 10.1017/s1431927616004256 |
| Databáze: | MEDLINE |
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