Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel.

Autor: Moore S; Interface Analysis Centre, HH Wills Physics Laboratory, University of Bristol, Bristol BS8 1TL, United Kingdom. Electronic address: stacy.moore@bristol.ac.uk., Warren AD; Interface Analysis Centre, HH Wills Physics Laboratory, University of Bristol, Bristol BS8 1TL, United Kingdom., Burrows R; National Nuclear Laboratory, Building 102B, Stonehouse Park, Sperry Way, Stonehouse, Gloucestershire GL10 3UT, United Kingdom., Payton OD; Interface Analysis Centre, HH Wills Physics Laboratory, University of Bristol, Bristol BS8 1TL, United Kingdom; Bristol Nano Dynamics Ltd., Bristol, United Kingdom., Picco L; Bristol Nano Dynamics Ltd., Bristol, United Kingdom; Department of Physics, Virginia Commonwealth University, VA, United States., Russell-Pavier FS; Interface Analysis Centre, HH Wills Physics Laboratory, University of Bristol, Bristol BS8 1TL, United Kingdom., Martin PG; Interface Analysis Centre, HH Wills Physics Laboratory, University of Bristol, Bristol BS8 1TL, United Kingdom., Martin TL; Interface Analysis Centre, HH Wills Physics Laboratory, University of Bristol, Bristol BS8 1TL, United Kingdom.
Jazyk: angličtina
Zdroj: Ultramicroscopy [Ultramicroscopy] 2021 Mar; Vol. 222, pp. 113210. Date of Electronic Publication: 2021 Jan 16.
DOI: 10.1016/j.ultramic.2021.113210
Abstrakt: The contact mode high-speed atomic force microscope (AFM) operates orders of magnitude faster than conventional AFMs. It is capable of capturing multiple frames per second with nanometre-scale lateral resolution and subatomic height resolution. This advancement in imaging rate allows for microscale analysis across macroscale surfaces, making it suitable for applications across materials science. However, the quality of the surface analysis obtained by high-speed AFM is highly dependent upon the standard of sample preparation and the resultant final surface finish. In this study, different surface preparation techniques that are commonly implemented within metallurgical studies are compared for samples of SAF 2205 duplex stainless steel. It was found that, while acid etching and electrolytic etching were optimal for the low resolution of optical microscopy, these methods were less suited for analysis by high resolution high-speed AFM. Mechanical and colloidal silica polishing was found to be the optimal method explored, as it provided a gentle etch of the surface allowing for high quality topographic maps of the sample surface.
(Copyright © 2021. Published by Elsevier B.V.)
Databáze: MEDLINE
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