| Autor: |
Aktas O, MacFarquhar SJ, Oo SZ, Tarazona A, Chong HMH, Peacock AC |
| Jazyk: |
angličtina |
| Zdroj: |
Optics express [Opt Express] 2020 Sep 28; Vol. 28 (20), pp. 29192-29201. |
| DOI: |
10.1364/OE.400536 |
| Abstrakt: |
We report nonlinear optical characterization of cm-long polycrystalline silicon (poly-Si) waveguides at telecom wavelengths. Laser post-processing of lithographically-patterned amorphous silicon deposited on silica-on-silicon substrates provides low-loss poly-Si waveguides with surface-tension-shaped boundaries. Achieving optical losses as low as 4 dB cm -1 enabled us to demonstrate effects of self-phase modulation (SPM) and two-photon absorption (TPA). Analysis of the spectral broadening and nonlinear losses with numerical modeling reveals the best fit values of the Kerr coefficient n2=4.5×10 -18 m W -1 and TPA coefficient βTPA=9.0×10 -12 m 2 W -1 , which are within the range reported for crystalline silicon. On-chip low-loss poly-Si paves the way for flexible integration of nonlinear components in multi-layered photonic systems. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
|
