| Autor: |
Taillon JA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Devers RF; Department of Electrical and Computer Engineering, University of Maryland, College Park, MD USA., Plante RL; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Newrock MW; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Lau JW; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Greene G; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA. |
