Corrigendum to "Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film" [Ultramicroscopy 189 (2018) 46-53].

Autor: Shiloh R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel. Electronic address: royshilo@post.tau.ac.il., Remez R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel., Lu PH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Jin L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Lereah Y; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel., Tavabi AH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Arie A; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel.
Jazyk: angličtina
Zdroj: Ultramicroscopy [Ultramicroscopy] 2020 Sep; Vol. 216, pp. 112965. Date of Electronic Publication: 2020 May 12.
DOI: 10.1016/j.ultramic.2020.112965
Databáze: MEDLINE
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