Autor: |
Amagai Y; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Shimazaki T; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Okawa K; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Kawae T; Department of Applied Quantum Physics, Kyusyu University, Fukuoka 819-0395, Japan., Fujiki H; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Kaneko NH; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan. |