| Autor: |
Cao S, Achlan M, Bryche JF, Gogol P, Dujardin G, Raşeev G, Le Moal E, Boer-Duchemin E |
| Jazyk: |
angličtina |
| Zdroj: |
Optics express [Opt Express] 2019 Nov 11; Vol. 27 (23), pp. 33011-33026. |
| DOI: |
10.1364/OE.27.033011 |
| Abstrakt: |
A new single-image acquisition technique for the determination of the dispersion relation of the propagating modes of a plasmonic multilayer stack is introduced. This technique is based on an electrically-driven, spectrally broad excitation source which is nanoscale in size: the inelastic electron tunnel current between the tip of a scanning tunneling microscope (STM) and the sample. The resulting light from the excited modes of the system is collected in transmission using a microscope objective. The energy-momentum dispersion relation of the excited optical modes is then determined from the angle-resolved optical spectrum of the collected light. Experimental and theoretical results are obtained for metal-insulator-metal (MIM) stacks consisting of a silicon oxide layer (70, 190 or 310 nm thick) between two gold films (each with a thickness of 30 nm). The broadband characterization of hybrid plasmonic-photonic transverse magnetic (TM) modes involved in an avoided crossing is demonstrated and the advantages of this new technique over optical reflectivity measurements are evaluated. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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