Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis.

Autor: Silva AM; Department of Dental Materials and Prosthodontics, Institute of Science and Technology of Sao Jose dos Campos, São Paulo State University (UNESP), Sao Jose dos Campos, Brazil., Figueiredo VMG; Department of Dental Materials and Prosthodontics, Institute of Science and Technology of Sao Jose dos Campos, São Paulo State University (UNESP), Sao Jose dos Campos, Brazil., Massi M; Mackenzie Presbyterian University, School of Engineering-PPGEMN, Sao Paulo, SP, Brazil., Prado RFD; Department of Dental Materials and Prosthodontics, Institute of Science and Technology of Sao Jose dos Campos, São Paulo State University (UNESP), Sao Jose dos Campos, Brazil., Silva Sobrinho ASD; Department of Physic, Technical Institute Aerospace (ITA), São José dos Campos, Brazil., Queiroz JRC; Department of Biotechnology, UnP - Laureate University, Natal, Brazil., Nogueira Junior L; Department of Dental Materials and Prosthodontics, Institute of Science and Technology of Sao Jose dos Campos, São Paulo State University (UNESP), Sao Jose dos Campos, Brazil.
Jazyk: angličtina
Zdroj: Journal of investigative and clinical dentistry [J Investig Clin Dent] 2019 Nov; Vol. 10 (4), pp. e12477. Date of Electronic Publication: 2019 Nov 11.
DOI: 10.1111/jicd.12477
Abstrakt: Aim: To analyze the effect of a silicon (Si)-based film deposited on yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) on the topography and bond strength of resin cement.
Methods: Specimens of zirconia were obtained and randomly divided into 4 groups, according to surface treatment: polished group (PG) zirconia; sandblasted group (SG) zirconia with aluminum oxide (100 µm); after polished, zirconia was coated with Si-based film group (SiFG); and after sandblasted, zirconia was coated with Si-based film group (SiFSG). The Si-based films were obtained through plasma-enhanced chemical vapor deposition. Surface roughness and contact angle analysis were performed. Resin cement cylinders were built up on the treated surface of blocks, after applying Monobond-S. The specimens were submitted to thermocycling aging and shear bond strength testing. The Kruskal-Wallis and Mann-Whitney U-tests were performed.
Results: There were significant differences between the surface treatments for each roughness parameter measured. Si-based film increased roughness and decreased the contact angle. Si-based film groups also demonstrated significantly lower bond strength values.
Conclusion: Si-based film produced using plasma deposition provided lower bond strength to resin cement compared with conventional treatment; however, the film deposition reduced the contact angle and improved roughness, favorable properties in the long way to prepare an optimum material.
(© 2019 John Wiley & Sons Australia, Ltd.)
Databáze: MEDLINE
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