Fabrication and characterization of Si 1- x Ge x nanocrystals in as-grown and annealed structures: a comparative study.
Autor: | Sultan MT; Reykjavik University, School of Science and Engineering, IS-101 Reykjavik, Iceland., Maraloiu AV; National Institute of Materials Physics, 077125 Magurele, Romania., Stavarache I; National Institute of Materials Physics, 077125 Magurele, Romania., Gudmundsson JT; Science Institute, University of Iceland, Dunhaga 3, IS-107 Reykjavik, Iceland.; Department of Space and Plasma Physics, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, SE-100 44, Stockholm, Sweden., Manolescu A; Reykjavik University, School of Science and Engineering, IS-101 Reykjavik, Iceland., Teodorescu VS; National Institute of Materials Physics, 077125 Magurele, Romania.; Academy of Romanian Scientists, 050094 Bucharest, Romania., Ciurea ML; National Institute of Materials Physics, 077125 Magurele, Romania.; Academy of Romanian Scientists, 050094 Bucharest, Romania., Svavarsson HG; Reykjavik University, School of Science and Engineering, IS-101 Reykjavik, Iceland. |
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Jazyk: | angličtina |
Zdroj: | Beilstein journal of nanotechnology [Beilstein J Nanotechnol] 2019 Sep 17; Vol. 10, pp. 1873-1882. Date of Electronic Publication: 2019 Sep 17 (Print Publication: 2019). |
DOI: | 10.3762/bjnano.10.182 |
Abstrakt: | Multilayer structures comprising of SiO (Copyright © 2019, Sultan et al.; licensee Beilstein-Institut.) |
Databáze: | MEDLINE |
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