| Autor: |
Mamyrbayev T; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany. talgat.mamyrbayev@kit.edu., Ikematsu K; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany.; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan., Meyer P; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany., Ershov A; Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, Karlsruhe, Germany., Momose A; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan., Mohr J; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany. |
| Abstrakt: |
A new super resolution imaging technique which potentially enables sub-µm spatial resolution, using a detector of pixels much larger than the spatial resolution, is proposed. The method utilizes sample scanning through a large number of identical X-ray microprobes periodically spaced (the period corresponds to a multiple of the pixel size), which reduces drastically the scanning time. The information about the sample illuminated by the microprobes is stored by large detector pixels. Using these data and sample position information, a super-resolution image reconstruction is performed. With a one-dimensional (1D) high aspect ratio nickel single lens array designed for theoretically expected sub-µm microprobes at 17 keV and fabricated by deep X-ray lithography and electroforming technique, 2 µm X-ray microprobes with a period of 10 µm were achieved. We performed a first experiment at KARA synchrotron facility, and it was demonstrated that the smallest structure of a test pattern with a size of 1.5 µm could be easily resolved by using images generated from a detector having a pixel size of 10.4 µm. This new approach has a great potential for providing a new microscopic imaging modality with a large field of view and short scan time. |
