Autor: |
Bastos JP; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium.; Department of Electrical Engineering , Katholieke Universiteit Leuven , Kasteelpark Arenberg 10 , B-3001 Leuven , Belgium., Uytterhoeven G; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium., Qiu W; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium., Paetzold UW; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium.; Institute of Microstructure Technology , Karlsruhe Institute of Technology , Hermann-von-Helmholtz-Platz 1 , Eggenstein-Leopoldshafen, 76344 Karlsruhe , Germany., Cheyns D; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium., Surana S; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium.; Department Physics , Katholieke Universiteit Leuven , Celestijnenlaan 200d , B-3001 Leuven , Belgium., Rivas J; Faculty of Science , University La Laguna , 38200 San Cristóbal de La Laguna , Spain., Jaysankar M; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium.; Department of Electrical Engineering , Katholieke Universiteit Leuven , Kasteelpark Arenberg 10 , B-3001 Leuven , Belgium., Song W; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium.; Department of Electrical Engineering , Katholieke Universiteit Leuven , Kasteelpark Arenberg 10 , B-3001 Leuven , Belgium., Aernouts T; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium., Poortmans J; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium.; Department of Electrical Engineering , Katholieke Universiteit Leuven , Kasteelpark Arenberg 10 , B-3001 Leuven , Belgium.; Institute for Materials Research & IMEC-associated lab IMOMEC , Hasselt University , Wetenschapspark 1 , B-3590 Diepenbeek , Belgium., Gehlhaar R; Imec-part of Solliance , Kapeldreef 75 , 3001 Heverlee , Belgium. |