| Autor: |
Kirkwood HJ, Letrun R, Tanikawa T, Liu J, Nakatsutsumi M, Emons M, Jezynski T, Palmer G, Lederer M, Bean R, Buck J, Di Dio Cafisio S, Graceffa R, Grünert J, Göde S, Höppner H, Kim Y, Konopkova Z, Mills G, Makita M, Pelka A, Preston TR, Sikorski M, Takem CMS, Giewekemeyer K, Chollet M, Vagovic P, Chapman HN, Mancuso AP, Sato T |
| Jazyk: |
angličtina |
| Zdroj: |
Optics letters [Opt Lett] 2019 Apr 01; Vol. 44 (7), pp. 1650-1653. |
| DOI: |
10.1364/OL.44.001650 |
| Abstrakt: |
Intense, ultrashort, and high-repetition-rate X-ray pulses, combined with a femtosecond optical laser, allow pump-probe experiments with fast data acquisition and femtosecond time resolution. However, the relative timing of the X-ray pulses and the optical laser pulses can be controlled only to a level of the intrinsic error of the instrument which, without characterization, limits the time resolution of experiments. This limitation inevitably calls for a precise determination of the relative arrival time, which can be used after measurement for sorting and tagging the experimental data to a much finer resolution than it can be controlled to. The observed root-mean-square timing jitter between the X-ray and the optical laser at the SPB/SFX instrument at European XFEL was 308 fs. This first measurement of timing jitter at the European XFEL provides an important step in realizing ultrafast experiments at this novel X-ray source. A method for determining the change in the complex refractive index of samples is also presented. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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