| Autor: |
Tamulewicz M; Faculty of the Microsystems Electronics and Photonics, Wroclaw University of Science and Technology, Wroclaw, Poland., Kutrowska-Girzycka J, Gajewski K, Serafińczuk J, Sierakowski A, Jadczak J, Bryja L, Gotszalk TP |
| Jazyk: |
angličtina |
| Zdroj: |
Nanotechnology [Nanotechnology] 2019 Jun 14; Vol. 30 (24), pp. 245708. Date of Electronic Publication: 2019 Mar 05. |
| DOI: |
10.1088/1361-6528/ab0caf |
| Abstrakt: |
We have examined the influence of flake-substrate effects that affect one and few layers of MoS 2 in terms of their electrical and optical properties. In the measurements, we used SiO 2 /Si substrates with etched cavities and aluminum electrodes. Suspended areas are easily identifiable both on images depicting the topography and on the surface potential maps measured with the Kelvin probe force microscopy. Compared to the SiO 2 /Si supported material, surface potential decrease is observable at the membrane. The surface potential value of the flakes located on the electrodes is the lowest. PL measurements prove that single MoS 2 monolayer was obtained. Suspended regions are also correlated with maps obtained as a result of Raman spectroscopy. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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