Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation.
| Autor: | Wahlstrand JK, Heilweil EJ |
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| Jazyk: | angličtina |
| Zdroj: | Optics express [Opt Express] 2018 Nov 12; Vol. 26 (23), pp. 29848-29853. |
| DOI: | 10.1364/OE.26.029848 |
| Abstrakt: | We perform contactless bulk mobility measurements for ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump THz probe experiment. As opposed to above-gap excitation or contact methods, two-photon absorption excites the entire sample thickness producing measurable signals with 10 13 carriers/cm 3 and higher density. For ZnTe and GaSe samples, the measured mobility using two-photon excitation is higher than that measured with one-photon excitation. |
| Databáze: | MEDLINE |
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