Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature.

Autor: Art L; Département Physique, Instrumentation, Environnement, Espace (ONERA/DPHY), Université de Toulouse, F-31055 Toulouse, France. laurent.artola@onera.fr., Youssef AA; Département Physique, Instrumentation, Environnement, Espace (ONERA/DPHY), Université de Toulouse, F-31055 Toulouse, France. ahmady07@live.com., Ducret S; Sofradir, 38113 Veurey-Voroize, France. Samuel.Ducret@sofradir.com., Perrier F; Sofradir, 38113 Veurey-Voroize, France. Franck.Perrier@sofradir.com., Buiron R; Sofradir, 38113 Veurey-Voroize, France. Raphael.Buiron@sofradir.com., Gilard O; Centre National d'Etude Spaciale (CNES), 31055 Toulouse, France. Olivier.Gilard@cnes.fr., Mekki J; Centre National d'Etude Spaciale (CNES), 31055 Toulouse, France. Julien.Mekki@cnes.fr., Boutillier M; Centre National d'Etude Spaciale (CNES), 31055 Toulouse, France. Mathieu.Boutillier@cnes.fr., Hubert G; Département Physique, Instrumentation, Environnement, Espace (ONERA/DPHY), Université de Toulouse, F-31055 Toulouse, France. guillaume.hubert@onera.fr., Poivrey C; European Space Research and Technology Centre (ESTEC), European Space Agency (ESA), 2201 AZ Noordwijk, The Netherlands. Christian.Poivey@esa.int.
Jazyk: angličtina
Zdroj: Sensors (Basel, Switzerland) [Sensors (Basel)] 2018 Jul 18; Vol. 18 (7). Date of Electronic Publication: 2018 Jul 18.
DOI: 10.3390/s18072338
Abstrakt: This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K. The analyses of the experimental data are completed using the SEE prediction tool MUSCA SEP3. The conclusions derived from the experimental measurements and related analyses allow to update the current SEE radiation hardness assurance (RHA) for readout integrated circuits of infrared image sensors used at cryogenic temperatures. The current RHA update is performed on SEE irradiation tests at room temperature, as opposed to the operational cryogenic temperature. These tests include SET (Single Event Transient), SEU (Single Event Upset) and SEFI (Single Event Functional Interrupt) irradiation tests. This update allows for reducing the cost of ROIC qualifications and the test setup complexity for each space mission.
Competing Interests: The authors declare no conflicts of interest.
Databáze: MEDLINE
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