Controlling evanescent waves using silicon photonic all-dielectric metamaterials for dense integration.

Autor:	Jahani S; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada.; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA., Kim S; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA.; Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX, 79409, USA., Atkinson J; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada., Wirth JC; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA., Kalhor F; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada.; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA., Noman AA; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA., Newman WD; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada.; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA., Shekhar P; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada., Han K; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA., Van V; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada., DeCorby RG; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada., Chrostowski L; Department of Electrical and Computer Engineering, University of British Columbia, Vancouver, BC, V6T 1Z4, Canada., Qi M; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA. mqi@purdue.edu.; Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. mqi@purdue.edu., Jacob Z; Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada. zjacob@purdue.edu.; School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA. zjacob@purdue.edu.
Jazyk:	angličtina
Zdroj:	Nature communications [Nat Commun] 2018 May 14; Vol. 9 (1), pp. 1893. Date of Electronic Publication: 2018 May 14.
DOI:	10.1038/s41467-018-04276-8
Abstrakt:	Ultra-compact, densely integrated optical components manufactured on a CMOS-foundry platform are highly desirable for optical information processing and electronic-photonic co-integration. However, the large spatial extent of evanescent waves arising from nanoscale confinement, ubiquitous in silicon photonic devices, causes significant cross-talk and scattering loss. Here, we demonstrate that anisotropic all-dielectric metamaterials open a new degree of freedom in total internal reflection to shorten the decay length of evanescent waves. We experimentally show the reduction of cross-talk by greater than 30 times and the bending loss by greater than 3 times in densely integrated, ultra-compact photonic circuit blocks. Our prototype all-dielectric metamaterial-waveguide achieves a low propagation loss of approximately 3.7±1.0 dB/cm, comparable to those of silicon strip waveguides. Our approach marks a departure from interference-based confinement as in photonic crystals or slot waveguides, which utilize nanoscale field enhancement. Its ability to suppress evanescent waves without substantially increasing the propagation loss shall pave the way for all-dielectric metamaterial-based dense integration.
Databáze:	MEDLINE
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