| Autor: |
Gorlach MA; The Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, NY, 10031, USA.; ITMO University, Saint Petersburg, 197101, Russia., Ni X; The Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, NY, 10031, USA.; The Graduate Center of the City University of New York, NY, 10016, USA., Smirnova DA; The Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, NY, 10031, USA., Korobkin D; The Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, NY, 10031, USA., Zhirihin D; ITMO University, Saint Petersburg, 197101, Russia., Slobozhanyuk AP; ITMO University, Saint Petersburg, 197101, Russia., Belov PA; ITMO University, Saint Petersburg, 197101, Russia., Alù A; The Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, NY, 10031, USA. alu@mail.utexas.edu.; The Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, 78712, USA. alu@mail.utexas.edu.; Advanced Science Research Center, City University of New York, New York, NY, 10031, USA. alu@mail.utexas.edu., Khanikaev AB; The Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, NY, 10031, USA. akhanikaev@ccny.cuny.edu.; ITMO University, Saint Petersburg, 197101, Russia. akhanikaev@ccny.cuny.edu.; The Graduate Center of the City University of New York, NY, 10016, USA. akhanikaev@ccny.cuny.edu. |
