X-ray microtomography system for small and light samples using a flat panel detector.

Autor: Vilar AB; Nuclear Engineering Program, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil., Dos Santos TMP; Nuclear Engineering Program, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil., Machado AS; Federal Institute of Education, Science and Technology of Rio de Janeiro, Nilópolis, Brazil., Oliveira DF; Nuclear Engineering Program, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil., Azeredo SR; Nuclear Engineering Program, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil., Lopes RT; Nuclear Engineering Program, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil.
Jazyk: angličtina
Zdroj: The Review of scientific instruments [Rev Sci Instrum] 2017 Oct; Vol. 88 (10), pp. 105112.
DOI: 10.1063/1.4996368
Abstrakt: A low-cost system able to perform microtomography of samples such as teeth, insects, or other small materials and low atomic numbers is presented. For this, a small flat panel type sensor was used. The process of characterization of the detector is detailed, as well as its main characteristics. The electromechanical control and the software used are also described. The advantages, some limitations, and comparisons with commercial systems are presented along with some three-dimensional volumetric reconstruction of different materials that served as samples during the development of the system.
Databáze: MEDLINE