Autor: |
Takeuchi S; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., McGehee WR; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Schaefer JL; University of Notre Dame, Department of Chemical and Biomolecular Engineering, Notre Dame, IN 46556, USA., Wilson TM; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Twedt KA; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland Nanocenter, University of Maryland, College Park, MD., Chang EH; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Soles CL; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Oleshko VP; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., McClelland JJ; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. |