| Autor: |
Pletincx S; Department of Materials and Chemistry, Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussels, Belgium.; Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States of America., Trotochaud L; Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States of America., Fockaert LL; Department of Materials Science and Engineering, Delft University of Technology, Mekelweg 2, 2628 CD, Delft, The Netherlands., Mol JM; Department of Materials Science and Engineering, Delft University of Technology, Mekelweg 2, 2628 CD, Delft, The Netherlands., Head AR; Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States of America., Karslıoğlu O; Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States of America., Bluhm H; Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States of America., Terryn H; Department of Materials and Chemistry, Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussels, Belgium., Hauffman T; Department of Materials and Chemistry, Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussels, Belgium. |
| Abstrakt: |
Probing initial interactions at the interface of hybrid systems under humid conditions has the potential to reveal the local chemical environment at solid/solid interfaces under real-world, technologically relevant conditions. Here, we show that ambient pressure X-ray photoelectron spectroscopy (APXPS) with a conventional X-ray source can be used to study the effects of water exposure on the interaction of a nanometer-thin polyacrylic acid (PAA) layer with a native aluminum oxide surface. The formation of a carboxylate ionic bond at the interface is characterized both with APXPS and in situ attenuated total reflectance Fourier transform infrared spectroscopy in the Kretschmann geometry (ATR-FTIR Kretschmann). When water is dosed in the APXPS chamber up to 5 Torr (~28% relative humidity), an increase in the amount of ionic bonds at the interface is observed. To confirm our APXPS interpretation, complementary ATR-FTIR Kretschmann experiments on a similar model system, which is exposed to an aqueous electrolyte, are conducted. These spectra demonstrate that water leads to an increased wet adhesion through increased ionic bond formation. |
