Evolution of defects in titanium grade 2 under Ti 2+ ion irradiation.
Autor: | Jouanny E; DCNS Research/CESMAN, Centre Grand Nantes - Technocampus Océan, 44340, Bouguenais, France.; DEN-Service de Recherches Métallurgiques Appliquées, CEA, Université Paris-Saclay, 91191, Gif-sur-Yvette, France.; Institut Jean Lamour - SI2M, CNRS UMR 7198, Université de Lorraine, 54011, Nancy CEDEX, France., Doriot S; DEN-Service de Recherches Métallurgiques Appliquées, CEA, Université Paris-Saclay, 91191, Gif-sur-Yvette, France., Malaplate J; DEN-Service de Recherches Métallurgiques Appliquées, CEA, Université Paris-Saclay, 91191, Gif-sur-Yvette, France., Dehmas M; Institut Jean Lamour - SI2M, CNRS UMR 7198, Université de Lorraine, 54011, Nancy CEDEX, France., Allais L; DEN-Département des Matériaux pour le Nucléaire, CEA, Université Paris-Saclay, 91191, Gif-sur-Yvette, France., Thuaut M; DCNS Research/CESMAN, Centre Grand Nantes - Technocampus Océan, 44340, Bouguenais, France., Millot T; DCNS Research/CESMAN, Centre Grand Nantes - Technocampus Océan, 44340, Bouguenais, France. |
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Jazyk: | angličtina |
Zdroj: | Journal of microscopy [J Microsc] 2017 Mar; Vol. 265 (3), pp. 275-286. Date of Electronic Publication: 2016 Dec 01. |
DOI: | 10.1111/jmi.12499 |
Abstrakt: | The complexity and diversity of microstructure involved in titanium alloys make it rather difficult to quantitatively describe defect evolution due to irradiation. This paper focuses on defect evolutions of commercially pure titanium grade 2 under Ti 2+ ion irradiation considering the effect of dose (0.6 and 3 dpa), temperature (300°C and 430°C) and flux (15:1 ratio). An irradiation damage profile was predicted using SRIM software to obtain a homogeneous damage on at least 500 nm depth for TEM observations and simulated using JANNUS-Saclay facility. The details regarding the quantification methodologies of the defects from dark field images are provided, as are the origins of the associated uncertainties. In addition to a tangled dislocation network, presence of the -type and (© 2016 The Authors Journal of Microscopy © 2016 Royal Microscopical Society.) |
Databáze: | MEDLINE |
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