| Autor: |
Patel S; Sandia National Lab, Livermore, CA 94550, USA. University of California at Berkeley, Berkeley, CA 94720, USA., Petty CW, Krafcik K, Loyola B, O'Bryan G, Friddle RW |
| Jazyk: |
angličtina |
| Zdroj: |
Nanotechnology [Nanotechnology] 2016 Oct 14; Vol. 27 (41), pp. 415705. Date of Electronic Publication: 2016 Sep 08. |
| DOI: |
10.1088/0957-4484/27/41/415705 |
| Abstrakt: |
Electrostatic modes of atomic force microscopy have shown to be non-destructive and relatively simple methods for imaging conductors embedded in insulating polymers. Here we use electrostatic force microscopy to image the dispersion of carbon nanotubes in a latex-based conductive composite, which brings forth features not observed in previously studied systems employing linear polymer films. A fixed-potential model of the probe-nanotube electrostatics is presented which in principle gives access to the conductive nanoparticle's depth and radius, and the polymer film dielectric constant. Comparing this model to the data results in nanotube depths that appear to be slightly above the film-air interface. This result suggests that water-mediated charge build-up at the film-air interface may be the source of electrostatic phase contrast in ambient conditions. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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