| Autor: |
Shortell MP, Hewins RA, Fernando JF, Walden SL, Waclawik ER, Jaatinen EA |
| Jazyk: |
angličtina |
| Zdroj: |
Optics express [Opt Express] 2016 Jul 25; Vol. 24 (15), pp. 17090-102. |
| DOI: |
10.1364/OE.24.017090 |
| Abstrakt: |
A thorough analysis of the resonance light scattering (RLS) technique for quantitative scattering measurements of subwavelength nanoparticles is reported. The systematic error associated with using a measurement at a single angle to represent all of the scattered light is investigated. In-depth analysis of the reference material was performed to identify and minimize the error associated with the reference material. Semiconductor ZnO nanobullets and spherical Au nanoparticles of various sizes were used to verify the approach. A simple and inexpensive modification to standard fluorometers is demonstrated using a glass prism allowing scattering measurements in the slightly forward and backwards directions. This allows quantification of the systematic error associated with RLS which is consistently overlooked. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
|
